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Power quality analysers grab more than 500 parameters

02 November, 2021

Fluke has announced a series of three-phase power quality analysers that, it says, will eliminate the complexities of power quality (PQ) logging, troubleshooting and analysis by offering automatic measurements, easy set-ups, best-in-class specifications, and simple reporting.

The Fluke 1770 Series analysers capture more than 500 power quality parameters by default, ensuring that critical PQ events are not missed – including fast transients up to 8kV, harmonics up to 30kHz, dips and swells, as well as voltage, current, and power.

The instruments can capture potentially damaging large, high-speed voltage transients, allowing users to mitigate their effects before equipment fails. Fluke says that the new instruments capture transients faster than ever before using the Intel’s latest Cyclone FPGAs. With a sample rate of 20 megasamples/s, users can capture, troubleshoot, and mitigate the most damaging PQ issues.

The instruments “walk technicians through the whole set-up to eliminate any measurement errors and ensure all the correct parameters are selected,” says product manager, Frank Healy. He adds that they will help to identify issues “faster and in a clearer manner to ensure the right data is always collected”.

Fluke’s new power quality analyser can capture potentially damaging large, high-speed voltage transients before equipment fails
Photo: Business Wire

Automatic measurement of the power and power quality parameters ensures that critical PQ data is captured as soon as a measuring session starts, without extensive set-up or selections. An “intuitive” user interface makes it easy to navigate between parameters at the push of a button.

The analysers come with Fluke’s Energy Analyze Plus software, which analyses power quality data without extensive training. It allows technicians to compare results with historical values, benchmark against industry norms, relate measured data to local conditions, and create a more complete picture of what’s occurring across the facility while the data is being collected.

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